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標題: | 多層板模型與電源完整度之最佳化分析 Modeling of Multilayer Structure and Analysis of Optimization on Power Integrity |
作者: | Ssu-Hsuan Hsu 徐巳烜 |
指導教授: | 吳瑞北 |
關鍵字: | 電源完整度,去耦合電容,短路連通柱, Power Integrity,Decoupling Capacitor,Shorting Via, |
出版年 : | 2008 |
學位: | 碩士 |
摘要: | 本論文主要是針對電源完整度的問題做探討。電源接地平面中,最主要的雜訊來自於信號線在穿過多層板時,引發層板間的接地彈跳雜訊。為了避免雜訊在層板間傳播導致電壓浮動、邏輯位準誤判,本論文採用了基因演算法結合三角網格電源接地平面模型,來針對實際不規則形狀的電源接地平面,完成指定位置的去耦合電容之最佳化。
本論文利用簡單的模型描述多層板的低頻特性,並探討短路連通柱對於電源完整度所造成的影響,最後針對矩形的結構提出一連通柱擺置的設計準則,以達到保持多層板電源完整度之目的。 The major theme of this thesis is focused on the problem of power integrity. Power integrity is a crucial issue to the stability of entire system. As noticed of the ground bounce noise for the primary noise of power-ground planes, it comes from the transition of signal current through a via which radiates the electromagnetic waves between planes. In order to avoid the voltage fluctuation, leading to misjudgment of digital signal, this thesis combines the genetic algorithm with the triangular-mesh scheme to model the power-ground planes, and thus optimizes the placement of decoupling capacitors on the specified locations for a realistically irregular-shaped geometry. This thesis discusses the low-frequency responses of multi-layered structures using a simple model which describes the effect of shorting vias on power integrity. Finally, the design rule of the placement of shorting vias is proposed to maintain the power integrity of multi-layered structures. |
URI: | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/26351 |
全文授權: | 未授權 |
顯示於系所單位: | 電信工程學研究所 |
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