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標題: | 利用非同步取樣的低功率消耗與小面積抖動偵測器 A Low-Power and Small-Area Jitter Detector Using Asynchronous Sampling |
作者: | Hsien-Che Chen 陳先哲 |
指導教授: | 劉深淵(Shen-Iuan Liu) |
關鍵字: | 資料抖動,晶載,多相位,非同步取樣,抖動分布,直方圖, data jitter,on-chip,multi-phase,asynchronous sampling,jitter distribution,histogram, |
出版年 : | 2017 |
學位: | 碩士 |
摘要: | 隨著半導體製程往摩爾定律方向持續前進,電路設計的技術日新月異,對於有線資料傳輸速度的要求也愈來愈高。然而,當資料在高速傳輸時卻受限於通道非線性造成的劣化,其中資料轉態點在時域上的不理想性稱為時間抖動。通常會在接收端加入等化器和時脈資料回復電路以緩解資料抖動情形,因此對於接收端電路特性評估而言,抖動為一個非常重要的考量因素。本論文旨在發展一適用於有線通訊系統接收端資料抖動的偵測器。訴求於低功耗及低面積的前提下,達到以單晶片系統電路測量的方式來取代昂貴的量測儀器。應用於25億位元每秒的接收端電路,藉由所提出的低速、多相位時脈、非同步的取樣方式,從高速傳輸的資料中,可準確偵測資料抖動的分佈。此電路實現於40奈米低功耗CMOS製程,操作於1.1伏特,偵測器的功率消耗僅2.55毫瓦。 最後,電路核心所占面積為18125平方微米。 The semiconductor process development follows the direction that Moore’s law sends. The skill of the circuit design also keeps growth in recent years. High-speed wireline communication is in high demand. However, the high-speed communication may suffer from the nonlinearity of the lossy channel. The imperfections of the received data in time domain is called “timing jitter”. Usually, an equalizer and a clock/data recovery circuit are two important building blocks, which are used to improve the jitter performance of the received data. Therefore, the jitter is one of the key factors to characterize the circuits of the receiver in wireline communication. This thesis introduces a jitter detector for the received data in wireline communication. The on-chip measurement using the low-power and small-area method can substitute for the expensive automatic test equipment. The proposed work is applied in 2.5Gb/s circuit of the receiver. By using the low-speed, multi-phase, and asynchronous method, the data jitter distribution could be detected accurately from the high-speed incoming data. This circuit is implemented in 40-nm CMOS Technology. The power consumption of the jitter detector is only 2.55mW from a 1.1V supply. Finally, the core occupies an area of 18125um^2. |
URI: | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/20800 |
DOI: | 10.6342/NTU201701460 |
全文授權: | 未授權 |
顯示於系所單位: | 電子工程學研究所 |
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ntu-106-1.pdf 目前未授權公開取用 | 3.95 MB | Adobe PDF |
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