請用此 Handle URI 來引用此文件：
http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/18215完整後設資料紀錄
| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.advisor | 王凡 | |
| dc.contributor.author | Yu-Ting Chang | en |
| dc.contributor.author | 張毓庭 | zh_TW |
| dc.date.accessioned | 2021-06-08T00:55:11Z | - |
| dc.date.copyright | 2015-03-16 | |
| dc.date.issued | 2015 | |
| dc.date.submitted | 2015-02-23 | |
| dc.identifier.citation | [1] Finkbeiner, Bernd, and Henny Sipma. 'Checking finite traces using alternating automata.' Formal Methods in System Design 24.2 (2004): 101-127.
[2] Havelund, Klaus, and Grigore Rosu. 'Testing linear temporal logic formulae on finite execution traces.' Research Institute for Advanced Computer Science, Tech. Rep (2001). [3] Priit Potter. “Plumbr.” https://plumbr.eu/ [4] Priit Potter. “Plumbr.” https://plumbr.eu/ [5] Oracle. “Visual VM.” http://www.captaincasa.com/pdf/techdoc_memprofiling.pdf [6] Simon Leppert. “Android memory dump analysis.” Department of Computer Science Friedrich-Alexander-University Erlangen-Nuremberg D – 91058 Erlangen: 6-7 [7] Open source. “Eclipse memory analyzer.” http://www.eclipse.org/mat/ [8] Schoren, Rob. 'Correspondence between Kripke Structures and Labeled Transition Systems for Model Minimization.' Seminar project, Technische Universiteit Eindhoven, Department of Computer Science. 2011. [9] Tarjan, Robert. 'Depth-first search and linear graph algorithms.' SIAM journal on computing 1.2 (1972): 146-160. [10] Cormen, Thomas H., et al. Introduction to algorithms (third edition). Vol. 2. Cambridge: MIT press, 2001. [11] Karp, Richard M. 'A characterization of the minimum cycle mean in a digraph.'Discrete mathematics 23.3 (1978): 309-311. [12] Dasdan, Ali, and Rajesh K. Gupta. 'Faster maximum and minimum mean cycle algorithms for system-performance analysis.' Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on 17.10 (1998): 889-899. [13] Android developers. “Investigate your RAM usage.” https://developer.android.com/tools/debugging/debugging-memory.html [14] Zorn, Benjamin. 'Comparing mark-and sweep and stop-and-copy garbage collection.' Proceedings of the 1990 ACM conference on LISP and functional programming. ACM, 1990. [15] Holzmann, Gerard J., Doron Peled, and Mihalis Yannakakis. 'On nested depth first search.' Proc. Second SPIN Workshop. Vol. 32. 1996. | |
| dc.identifier.uri | http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/18215 | - |
| dc.description.abstract | 近代，手機的應用程式數量愈來愈多而且開發過程也愈來愈快速。由於對應用程式各種要求以及技術限制，行動運算裝置的軟體開發是一大挑戰。在軟體測試的產業中，工程師們總是要花費大量的時間去產生待測系統的測試資料，現有技術中許多也必須仰賴程式原始碼來產生測試資料，其中，記憶體滲透更是測試中難以被檢測出的項目。為此，我們開發了一個黑箱記憶體滲漏測試自動化來生成測試範例。我們從執行後的運行紀錄建置模型，並且用深度優先及的最小平均權重環的演算法自動產生測試資料。之後在安卓系統的手機上執行這些測試資料查看測試系統是否有記憶體滲漏。最後，將有潛在錯誤的測試資料回報給使用者，並將相關技術製作成工具提供給使用者。 | zh_TW |
| dc.description.abstract | Nowadays, the amount of mobile application increases dramatically and the development process becomes faster and faster. Software development of mobile computing is currently challenging due to the various demands and technical constraints of mobile development. When it comes to software testing in the industry, engineers spend lots of time to produce test cases themselves. Within the testing stage, memory leakage bugs of apps are notorious to detect. Furthermore, we often need to deal with system under test (SUT) without source code. Existing techniques usually rely on the availability of source code and instrumentation techniques to generate test cases. Due to the issues, we have developed a framework to automated black-box testing for memory leakage of application. We build the model from the SUT by the execution traces, and use the concept of depth-first search and Karp’s algorithm to generate test cases. Then, executing the test cases to check the memory leakage of the SUT on android mobile application. Finally, we report the test case of potential error to the user, and using the related techniques to build a software testing tool. | en |
| dc.description.provenance | Made available in DSpace on 2021-06-08T00:55:11Z (GMT). No. of bitstreams: 1 ntu-104-R01943136-1.pdf: 3084917 bytes, checksum: e66b6d1f9347f9568635736c62d81926 (MD5) Previous issue date: 2015 | en |
| dc.description.tableofcontents | 致謝 I
中文摘要 III ABSTRACT IV CONTENT V LIST OF FIGURES VII LIST OF TABLES IX Chapter 1 Introduction - 1 - 1.1 Background - 1 - 1.2 Motivation - 2 - 1.3 Purpose - 4 - 1.4 Theoretical framework - 5 - 1.6 Experiment design - 7 - 1.7 Organization - 8 - Chapter 2 Related Work - 9 - 2.1 Plumbr - 9 - 2.2 Visual VM - 10 - 2.3 Eclipse memory analyzer (MAT) - 11 - 2.4 Tools analysis - 12 - Chapter 3 Preliminary - 13 - 3.1 Appeck - 13 - 3.2 Trace - 13 - 3.3 Model - 14 - 3.4 Depth-first Search - 15 - 3.5 Karp’s max/min cycle mean-weight algorithm - 18 - 3.6 Memory management in Android - 20 - 3.7 Android OS and SDK - 22 - Chapter 4 Running Example - 23 - 4.1 Generate traces and build model - 23 - 4.2 Finding Lasso - 25 - 4.3 Executing test cases - 28 - Chapter 5 Procedure - 30 - 5.1 High level procedure - 30 - 5.2 Build model - 33 - 5.3 Use two different algorithms to find suspicious traces - 35 - 5.4 Generate Lasso - 36 - 5.5 Test case execution - 37 - Chapter 6 DFS algorithm for directed memory leakage loop detection - 38 - 6.1 Depth-first Search extension - 38 - Chapter 7 Extending Karp’s Algorithm for Generating K maximum mean leakage cycle - 40 - 7.1 Karp’s minimum mean-weight cycle extension - 40 - Chapter 8 Implementation - 45 - 8.1 Android ripping - 45 - 8.2 Web application - 46 - 8.3 Modeling & test case generating - 46 - 8.4 Use case of the tool - 47 - Chapter 9 Experiment Analysis - 52 - 9.1 Benchmark - 53 - 9.2 Experiment platform - 55 - 9.3 Experiment data - 55 - 9.4 Memory Analysis - 72 - Chapter 10 Conclusion and Future Work - 75 - REFERENCE - 78 - | |
| dc.language.iso | en | |
| dc.title | 應用程式記憶體滲漏之自動化黑箱檢測技術 | zh_TW |
| dc.title | Automated Black-Box Testing for Memory Leakage of Application Programs | en |
| dc.type | Thesis | |
| dc.date.schoolyear | 103-1 | |
| dc.description.degree | 碩士 | |
| dc.contributor.oralexamcommittee | 江介宏,陳郁方,顏嗣鈞,王柏堯 | |
| dc.subject.keyword | 軟體測試,應用程式測試,黑箱測試,記憶體滲漏,深度優先搜尋,最小平均權重環, | zh_TW |
| dc.subject.keyword | software testing,application testing,black-box testing,memory leakage,minimum mean-weight cycle,depth-first search, | en |
| dc.relation.page | 79 | |
| dc.rights.note | 未授權 | |
| dc.date.accepted | 2015-02-23 | |
| dc.contributor.author-college | 電機資訊學院 | zh_TW |
| dc.contributor.author-dept | 電子工程學研究所 | zh_TW |
| 顯示於系所單位： | 電子工程學研究所 | |
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| ntu-104-1.pdf 未授權公開取用 | 3.01 MB | Adobe PDF |
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