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  1. NTU Theses and Dissertations Repository
  2. 電機資訊學院
  3. 電子工程學研究所
請用此 Handle URI 來引用此文件: http://tdr.lib.ntu.edu.tw/jspui/handle/123456789/16798
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dc.contributor.advisor黃俊郎(Jiun-Lang Huang)
dc.contributor.authorRui Maoen
dc.contributor.author毛睿zh_TW
dc.date.accessioned2021-06-07T23:46:18Z-
dc.date.copyright2014-07-04
dc.date.issued2014
dc.date.submitted2014-06-19
dc.identifier.citation[1] W. R. Davis et al., “Demystifying 3D ICs: The Pros and Cons of Going Vertical”, IEEE Design Test on Computers, Vol 22, Issue 8,pp. 498-510, Nov 2005.
[2] J. A. Davis et al. “Interconnect Limits on Gigascale Integration(GSI) in the 21st Century”, Proc. IEEE, Vol 89, Issue 3, pp. 305-224, 2001.
[3] P. Garrou, Christopher Bower and Pater Ramm, ”Handbook of 3D Integration”, Wiley-VCH, 2008.
[4] Real World Technologies. '3D Integration: A Revolution in Design'. May 2, 2007.
[5] S. Reda, G. Smith and L. Smith, “Maximizing the Functional Yield of Wafer-to- Wafer 3-D Integration”, IEEE Transactions on Very Large Scale Integration Systems, Vol 17, Issue 9, pp. 1357-1362, 2010.
[6] E. Singh, “Exploiting rotational symmetries for improved stacked yields in W2W 3D-SICs”, IEEE VLSI Test Symposium, pp. 32-37, 2011.
[7] J. Verbree, E.J. Marinissen, P. Roussel and D. Velenis, “On the Cost-Effectiveness of Matching Repositories of Pre-Tested Wafers for Wafer-to-Wafer 3D Chip Stacking”, IEEE European Test Symposium, pp. 36-41, May 2010.
[8] M. Taouil, S. Hamdioui, J. Verbree and E.J. Marinissen, On Maximizing the Compound Yield for 3D Wafer-to-Wafer Stacked ICs, IEEE International Test Conference, pp. 1-10, 2010.
[9] J. Munkres, 'Algorithms for the Assignment and Transportation Problems', Journal of the Society of Industrial and Applied Mathematics, 5(1):32-38, 1957. C. D. Jones, A. B. Smith, and E.F. Roberts, Book Title, Publisher, Location, Date.
dc.identifier.urihttp://tdr.lib.ntu.edu.tw/jspui/handle/123456789/16798-
dc.description.abstract隨著積體電路技術的不斷發展,電路尺寸更小,性能更高,成本也變得越來越高。使用矽穿孔(TSV)技術的三維記憶體是一種新興的技術,相比平面積體電路有更高的性能和更低的功耗。然而三維記憶體的堆疊產量仍然是一個問題。
在這篇論文中,我們提出了一個改進自匈牙利方法(The Hungarian Method of Assignment)的新演算法對三維記憶體(3D Memory)進行晶圓到晶圓堆疊。實驗結果表明我們的算法可以在一個合理的時間內,給出較高的堆疊良率。
zh_TW
dc.description.abstractAs the process technology continues to evolve, IC become smaller and high performance, and the cost become higher. A 3D-IC uses Through Silicon Via (TSV) is an emerging technology, higher performance, and lower power consumption compared to planar ICs. However stacking yield is a problem of 3D-IC.
In this thesis, we propose a new algorithm using improved from the hungarian method of assignment on the three-dimensional memory for wafer to wafer stacking. Our results show that our algorithm can be a reasonable amount of time, given the higher stacking yield.
en
dc.description.provenanceMade available in DSpace on 2021-06-07T23:46:18Z (GMT). No. of bitstreams: 1
ntu-103-R00943152-1.pdf: 919985 bytes, checksum: 36fca3d235803227306bf94982b93e4c (MD5)
Previous issue date: 2014
en
dc.description.tableofcontents口試委員會審定書 #
誌謝 i
中文摘要 ii
ABSTRACT iii
CONTENTS iv
LIST OF FIGURES vi
LIST OF TABLES vii
Chapter 1 Introduction 1
1.1 採用矽穿孔技術的三維積體電路 1
1.2 三維積體電路的堆疊技術 2
1.3 晶圓到晶圓堆疊的相關研究 3
1.4 論文目的 3
1.5 論文構成 3
Chapter 2 Preliminaries 5
2.1 指派問題 5
2.2 匈牙利方法 6
Chapter 3 The Proposed Method 12
3.1 三維記憶體堆疊問題 12
3.2 超平面覆蓋法 14
3.3 演算法的對稱性 19
3.4 相似度優先演算法 21
Chapter 4 Simulation Results 27
Chapter 5 Conclusions and Future Work 31
5.1 結論 31
5.2 未來工作 31
REFERENCE 33
dc.language.isozh-TW
dc.title三維記憶體的晶圓到晶圓堆疊演算法zh_TW
dc.titleA 3D Memory Wafer To Wafer Stacking Algorithmen
dc.typeThesis
dc.date.schoolyear102-2
dc.description.degree碩士
dc.contributor.oralexamcommittee李建模(Chien-Mo Li),李進福(Jin-Fu Li)
dc.subject.keyword三維記憶體,晶圓到晶圓,堆疊,演算法,zh_TW
dc.subject.keyword3D Memory,Wafer To Wafer,Stacking,Algorithm,en
dc.relation.page33
dc.rights.note未授權
dc.date.accepted2014-06-19
dc.contributor.author-college電機資訊學院zh_TW
dc.contributor.author-dept電子工程學研究所zh_TW
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