Browsing by Subject (1 0 0) silicon wafer
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| Publication Year | Title | Author(s) | Department |
|---|---|---|---|
| 2015 | 光反射與外差干涉術應用於波長與微小角度變化量測 The Application of Light Reflection and Heterodyne Interferometer in the Measurement of Wavelength and Small Angle Variations | Meng Chang Hsieh; 謝孟璋 | 應用力學研究所 |