Browsing by Author Chin-Hui Liu
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| Publication Year | Title | Author(s) | Department |
|---|---|---|---|
| 2025 | 探討降低驅動IC成品最終測試功能性良率損失方法之研究 Research on Methods to Reduce the Functional Yield Loss in the Final Testing of Driver IC Products | 劉金輝; Chin-Hui Liu | 工業工程學研究所 |